Cedergren, Karin (2008) Intrinsic Josephson pi-junctions for novel devices. [Tesi di dottorato] (Inedito)

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Tipologia del documento: Tesi di dottorato
Lingua: English
Titolo: Intrinsic Josephson pi-junctions for novel devices
Autori:
AutoreEmail
Cedergren, Karinkarin.cedergren@chalmers.se
Data: 1 Dicembre 2008
Numero di pagine: 112
Istituzione: Università degli Studi di Napoli Federico II
Istituzioni (extra): INFM - Coherentia
Dipartimento: Scienze fisiche
Dottorato: Tecnologie innovative per materiali, sensori ed imaging
Ciclo di dottorato: 20
Coordinatore del Corso di dottorato:
nomeemail
Abbate, Giancarlo[non definito]
Tutor:
nomeemail
Tafuri, Francesco[non definito]
Lombardi, Floriana[non definito]
Data: 1 Dicembre 2008
Numero di pagine: 112
Parole chiave: Josephson HTS d-wave grain-boundary biepitaxial
Settori scientifico-disciplinari del MIUR: Area 02 - Scienze fisiche > FIS/03 - Fisica della materia
Area 02 - Scienze fisiche > FIS/01 - Fisica sperimentale
Depositato il: 18 Nov 2009 09:53
Ultima modifica: 19 Gen 2015 11:54
URI: http://www.fedoa.unina.it/id/eprint/3461
DOI: 10.6092/UNINA/FEDOA/3461

Abstract

The properties of YBCO grain boundary Josephson junctions have been studied experimentally. Due to the d-wave symmetry of the order parameter of YBCO it is possible to have junctions with a 0-π phase discontinuity along the barrier profile. Such 0-π-junctions can have a ground state where spontaneous flux is generated at the discontinuity point. This work has been focused on understanding if it is possible to fabricate biepitaxial grain boundary 0-π-junctions that, despite the unavoidable faceting along the grain boundary line, can have a ground state with spontaneously generated flux. The interest in the biepitaxial technique lies in its flexibility for circuit design. The microstructure and transport properties of the grain boundary junctions have been studied in details. Scanning SQUID Microscope imaging has revealed the presence of spontaneous flux in our junctions. Finally the dynamics of 0-π-junctions compared to conventional 0-junctions have been studied and compared to simulation.

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