Daliento, Santolo and Spirito, Paolo and Gialanella, Lucio and Limata, Benedicta Norman and Romano, Mario (2006) Experimental measurement of in-depth secondary defect distribution prodced by Helium implantation in silicon. [Pubblicazione in rivista scientifica]

Full text not available from this repository.
Item Type: Pubblicazione in rivista scientifica
Date Deposited: 20 Oct 2010 08:01
Last Modified: 30 Apr 2014 19:42
URI: http://www.fedoa.unina.it/id/eprint/6409

Actions (login required)

View Item View Item