Daliento, Santolo and Spirito, Paolo and Gialanella, Lucio and Limata, Benedicta Norman and Romano, Mario
(2006)
Experimental measurement of in-depth secondary defect distribution prodced by Helium implantation in silicon.
[Pubblicazione in rivista scientifica]
Full text not available from this repository.
| Item Type: |
Pubblicazione in rivista scientifica
|
| Title: |
Experimental measurement of in-depth secondary defect distribution prodced by Helium implantation in silicon |
| Creators: |
| Creators | Email |
|---|
| Daliento, Santolo | UNSPECIFIED | | Spirito, Paolo | UNSPECIFIED | | Gialanella, Lucio | UNSPECIFIED | | Limata, Benedicta Norman | UNSPECIFIED | | Romano, Mario | UNSPECIFIED |
|
| Autore/i: |
S. DALIENTO; MELE L.; P. SPIRITO; GIALANELLA L; LIMATA B.N; ROMANO M |
| Date: |
2006 |
| Number of Pages: |
0 |
| Department: |
Scienze fisiche |
| Journal or Publication Title: |
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS |
| Date: |
2006 |
| Volume: |
253 |
| Page Range: |
pp. 90-93 |
| Number of Pages: |
0 |
[error in script]
[error in script]
| Date Deposited: |
20 Oct 2010 08:01 |
| Last Modified: |
30 Apr 2014 19:42 |
| URI: |
http://www.fedoa.unina.it/id/eprint/6409 |
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