Barra, Mario and Cassinese, Antonio and Guido, Stefano and Tomaiuolo, Giovanna (2007) An electric criterion to evaluate glass transition temperature dielectric relaxation measurements. [Pubblicazione in rivista scientifica]
Il contenuto (Full text) non è disponibile all'interno di questo archivio.Tipologia del documento: | Pubblicazione in rivista scientifica |
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Lingua: | English |
Titolo: | An electric criterion to evaluate glass transition temperature dielectric relaxation measurements |
Autori: | Autore Email Barra, Mario [non definito] Cassinese, Antonio [non definito] Guido, Stefano [non definito] Tomaiuolo, Giovanna [non definito] |
Autore/i: | P. D’Angelo , M. Barra, A. Cassinese, S. Guido, G. Tomaiuolo |
Data: | 2007 |
Numero di pagine: | 7 |
Dipartimento: | Scienze fisiche |
Titolo del periodico: | MACROMOLECULAR SYMPOSIA |
Data: | 2007 |
Volume: | 247 |
Intervallo di pagine: | pp. 43-49 |
Numero di pagine: | 7 |
Depositato il: | 20 Ott 2010 08:33 |
Ultima modifica: | 30 Apr 2014 19:42 |
URI: | http://www.fedoa.unina.it/id/eprint/6629 |
Abstract
In this contribution, a dielectric measurement technique for the evaluation of phase transition temperature and the study of physical aging on polymeric thin films is considered. This kind of measurement provides the possibility of displaying phase transitions with a high degree of precision. Furthermore, it can be considered alternatively to techniques not applicable in the case of thin films, such as Differential Scanning Calorimetry (DSC). In this work, owing to the high sensitivity of the utilized experimental set-up, a glass transition TG of 156 K, with a precision equal to 0.3%, and a melting TM=220 K have been assessed for 4 micron thick Polydimethylsiloxane (PDMS) films. Performing measurement as a function of time, it was possible to monitor physical aging phenomena, mainly consisting in a change of dielectric properties. As expected, the time evolution of the aging phenomena can be described by a simple logarithmic law.
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