Faella, Marco (2009) Linear and Branching System Metrics. [Pubblicazione in rivista scientifica]
Il contenuto (Full text) non è disponibile all'interno di questo archivio.Tipologia del documento: | Pubblicazione in rivista scientifica |
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Lingua: | English |
Titolo: | Linear and Branching System Metrics |
Autori: | Autore Email Faella, Marco [non definito] |
Autore/i: | L. de Alfaro, M. Faella, M. Stoelinga |
Data: | 2009 |
Numero di pagine: | 15 |
Dipartimento: | Scienze fisiche |
Titolo del periodico: | IEEE TRANSACTIONS ON SOFTWARE ENGINEERING |
Data: | 2009 |
Volume: | 35 |
Numero: | 2 |
Intervallo di pagine: | pp. 258-273 |
Numero di pagine: | 15 |
Parole chiave: | simulation, metrics |
Depositato il: | 21 Ott 2010 06:57 |
Ultima modifica: | 30 Apr 2014 19:43 |
URI: | http://www.fedoa.unina.it/id/eprint/7605 |
Abstract
We extend the classical system relations of trace inclusion, trace equivalence, simulation, and bisimulation to a quantitative setting in which propositions are interpreted not as boolean values, but as elements of arbitrary metric spaces. Trace inclusion and equivalence give rise to asymmetrical and symmetrical linear distances, while simulation and bisimulation give rise to asymmetrical and symmetrical branching distances. We study the relationships among these distances, and we provide a full logical characterization of the distances in terms of quantitative versions of LTL and mu-calculus. We show that, while trace inclusion (resp. equivalence) coincides with simulation (resp. bisimulation) for deterministic boolean transition systems, linear and branching distances do not coincide for deterministic metric transition systems. Finally, we provide algorithms for computing the distances over finite systems, together with a matching lower complexity bound.
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