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Di Cicco, Adele (2007) Development of a FPGA based test system for Double Data Rate high speed memory devices. [Tesi di dottorato] (Unpublished)

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Item Type: Tesi di dottorato
Resource language: English
Title: Development of a FPGA based test system for Double Data Rate high speed memory devices
Creators:
CreatorsEmail
Di Cicco, AdeleUNSPECIFIED
Date: 2007
Date type: Publication
Number of Pages: 92
Institution: Università degli Studi di Napoli Federico II
Department: Scienze fisiche
Dottorato: Tecnologie innovative per materiali, sensori ed imaging
Ciclo di dottorato: 17
Coordinatore del Corso di dottorato:
nomeemail
Vaglio, RuggeroUNSPECIFIED
Tutor:
nomeemail
Aloisio, AlbertoUNSPECIFIED
Date: 2007
Number of Pages: 92
Keywords: Double data rate; Signal integrity; Jitter
Settori scientifico-disciplinari del MIUR: Area 02 - Scienze fisiche > FIS/01 - Fisica sperimentale
Date Deposited: 14 May 2008
Last Modified: 30 Apr 2014 19:26
URI: http://www.fedoa.unina.it/id/eprint/1591
DOI: 10.6092/UNINA/FEDOA/1591

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