Abbate, Giancarlo and Ambrosone, Giuseppina and Coscia, Ubaldo and Marino, Antigone
(2010)
Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by plasma enhanced chemical vapor deposition.
[Pubblicazione in rivista scientifica]
Full text not available from this repository.
| Item Type: |
Pubblicazione in rivista scientifica
|
| Title: |
Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by plasma enhanced chemical vapor deposition |
| Creators: |
| Creators | Email |
|---|
| Abbate, Giancarlo | UNSPECIFIED | | Ambrosone, Giuseppina | UNSPECIFIED | | Coscia, Ubaldo | UNSPECIFIED | | Marino, Antigone | UNSPECIFIED |
|
| Autore/i: |
D. K. Basa, G. Abbate, G. Ambrosone, U. Coscia, A. Marino |
| Date: |
2010 |
| Number of Pages: |
0 |
| Department: |
Scienze fisiche |
| Journal or Publication Title: |
JOURNAL OF APPLIED PHYSICS |
| Date: |
2010 |
| Volume: |
107 |
| Page Range: |
pp. 23502-23507 |
| Number of Pages: |
0 |
[error in script]
[error in script]
| Date Deposited: |
21 Oct 2010 07:39 |
| Last Modified: |
30 Apr 2014 19:43 |
| URI: |
http://www.fedoa.unina.it/id/eprint/7731 |
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