Abbate, Giancarlo, Ambrosone, Giuseppina, Coscia, Ubaldo and Marino, Antigone (2010) Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by plasma enhanced chemical vapor deposition. [Pubblicazione in rivista scientifica]
Full text not available from this repository.| Item Type: | Pubblicazione in rivista scientifica |
|---|---|
| Title: | Spectroscopic ellipsometry study of hydrogenated amorphous silicon carbon alloy films deposited by plasma enhanced chemical vapor deposition |
| Creators: | Creators Email Abbate, Giancarlo UNSPECIFIED Ambrosone, Giuseppina UNSPECIFIED Coscia, Ubaldo UNSPECIFIED Marino, Antigone UNSPECIFIED |
| Autore/i: | D. K. Basa, G. Abbate, G. Ambrosone, U. Coscia, A. Marino |
| Date: | 2010 |
| Number of Pages: | 0 |
| Department: | Scienze fisiche |
| Journal or Publication Title: | JOURNAL OF APPLIED PHYSICS |
| Date: | 2010 |
| Volume: | 107 |
| Page Range: | pp. 23502-23507 |
| Number of Pages: | 0 |
| Date Deposited: | 21 Oct 2010 07:39 |
| Last Modified: | 30 Apr 2014 19:43 |
| URI: | http://www.fedoa.unina.it/id/eprint/7731 |
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